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Indiana Microscopy Society

An Affiliate of the Microscopy
Society of America

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News From the Secretary: October 20, 2011


Dear INMS Members,

Fall INMS Meeting November 17, 2011

Mark your calendar now for Thursday, November 17, 5pm - 8 pm, for the Indiana Microscopy Society Fall Meeting. The Meeting will be held at the Indianapolis Museum of Art, located at the intersection of 38th and Michigan Road (4000 Michigan Rd.). Our host will be Dr. Gregory Smith, The Otto N. Frenzel III Senior Conservation Scientist. The Fall meeting is being sponsored by Carl Zeiss Microscopy, LLC and the IMA.

You may come to the museum anytime before the meeting starts to visit the exhibits. Admission to the IMA is free! Parking in the underground garage or the closest surface lot is $5, although free parking is available in any un-gated lot or when the gates are open on any other lot.

There will be a complimentary catered buffet dinner at the Museum’s Nourish Café starting at 5 PM , followed by a brief business meeting. Everyone who attends will be eligible for door prizes. The program will be a talk by Dr. Smith about the many microscopies and microspectroscopies used in the analysis and treatment of artwork. Dr. Smith will also give the attendees a tour of the Art Conservation Science Lab, which is like no other lab you have seen! The museum is open until 9 PM on Thursdays, again leaving a great opportunity to visit the galleries following the program. Use this meeting as an opportunity to invite a friend or associate to join the INMS and attend this great event.

Please reserve your space by sending an email stating your intention to attend and number in your group. Also, the Fall Meeting will be a good time to renew your membership in the Indiana Microscopy Society.


Profiles of INMS Members

The purpose of these member profiles is to help the INMS membership learn the scientific and personal interests of various members to foster networking within our society.

Clif Duhn

Clif is the treasurer of the Indiana Microscopy Society. Clif is from San Francisco, CA, and was influenced to pursue a scientific career by coming from family of doctors. He graduated in Biology from the Univ of California, Davis and is currently employed by IUPUI-IUSD School of Densitry. Clif's microscopy expertise is in SEM with EDS, Micro-CT, Profilometry andTerahertz Pulsed Imaging and he uses this technology in various fields of research.

Fellow INMS members might be surprised to know that Clif was once a competitive skateboarder. Clif's advice to further your knowledge in microscopy and imaging is to read lots of Wikipedia articles on subjects that interest you.

Mike Esterman

Mike is the secretary and past president of the INMS. Mike grew up in Valdosta, Ga and his interest in pursuing a career in science was sparked by the chemistry set his father gave him for Christmas when he was 10 years old. Mike attended Georgia Tech and received undergrad degrees in Chemistry and Biology. He also received his Master of Science in Biology. Mike retired from Eli Lilly and Company in 2006 after a 39 year career that involved research in cancer , asthma and osteoarthritis and the development of digital imaging as a technology for drug discovery. Currently he accepts occasional short term consulting assignments in microscopy and imaging. Mike's technology expertise is in confocal, bright-field and fluorescence microscopy.

Mike has received several awards and recognitions including: M.A. Ferst Research Award - Georgia Tech Chapter of Sigma Xi 1967; Presidential Award for Innovative Research, Lilly Research Labs, 1999; Quality Advocate Award, Eli Lilly and Company, 2001; and Global System Achievement Award for Sustained Impact, Eli Lilly and Company, 2001

His current hobbies are microscopy studying pollen, the micro-structure of hair and pond life, vegetable gardening, travel, reading and Old Testament studies.

Mike's advice to further your knowledge is to attend conferences such as Microscopy and MicroAnalysis to network with other scientists and to broaden your knowledge of fields of microscopy you are not involved in.


Microscopy Society of America

Expand your knowledge of microscopy with MSA membership! Regular membership is $60 per year and Student membership is $20 per year. Members receive: subscription to Microscopy and Microanalysis and Microscopy Today, discounts on books, journals and other educational materials, MSA awards programs, speaker opportunities, and scholarships, and peer networking through the society's focused interest groups. The Microscopy and Microanalysis 2013 conference will be right here in Indianapolis.

From Our Corporate Sponsors

Indiana University Purchases Carl Zeiss AURIGA 60 SEM+FIB

Indiana University Nanoscale Characterization Facility (NCF) has purchased the Carl Zeiss AURIGA 60 focused ion beam (FIB) instrument. The purchase was funded in part by the National Science Foundation. The AURIGA will be housed in the NCF located in Simon Hall, IU’s multidisciplinary science building, and will be available to students, faculty, and staff in Chemistry, Biology, Biochemistry, Physics, and Geology.

Carl Zeiss Microscopy, LLC

Area Specialist, Charged Particle Microscopy: James B Smith
Mobile: 978-395-5553
Office: 260-387-6923
For more product information:



Bruker Nano introduces the new XFlash 5060T for (S)TEM. This is the first large area (>50 sq mm) Silicon Drift Detector (SDD) designed to fit in a small diameter detector tube so:

For information contact



EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has established a new standard in electron microscopy with its release of the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The new series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version.

With the launch of the Apollo XLT SDD Series, EDAX introduces the world's first SDD for the TEM with data acquisition and signal processing electronics fully integrated into the detector. The Apollo XLT detector eliminates the need for a separate electronics enclosure for signal processors. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer.


Please Support the INMS Corporate Members

Applied Precision
Carl Zeiss Microscopy
Electron Microscopy Sciences
FEI Company
Gatan, Inc.
Hitachi HTA
IXRF Systems, Inc
Mager Scientific, Inc
Oxford Instruments
Ted Pella, Inc

Contact the Secretary

Mike Esterman, Secretary
Indiana Microscopy Society
7263 North Baltimore Rd
Monrovia, IN 46157